Angular properties of refractive index sensor based on reflection interferometer

The angular properties of sensor, implemented in Kretschmann?s scheme, where the optimized for oblique incidence light thin-film reflection interferometer acts as a sensing element, are described paper. Analytical equations, defining sensor?s S and P polarization states at working wavelength vicinity angle incidence, provided, well approximate equations main parameters sensor: sensitivity, full width half maximum, contrast figure merit. possibility to vary named by choosing appropriate metal dielectric layers structure is shown. For an example, numerical calculations made one special cases, state, having larger figures dependencies on number base thickness demonstrated. It shown, that measurements with this method theoretically capable infinite merit, practice they only limited losses layered beam divergency. recommendations experimental realization given. Keywords: interferometer, total internal reflection, refractive index sensor.